A Fundamental Approach to Dipmeter Analysis

$2.00

Milton B. Enderlin,
Diana K.T. Hansen,
Gearhart Industries, Inc.

Abstract

Historically, in dipmeter analysis, depositional patterns are delineated for environmental, structural, and stratigraphic interpretations. The proposed method is a fundamental approach using raw data measurements from the dipmeter sonde to help the geologist describe subsurface structures on a stratigraphic scale. Raw data are available at the well site, require no post-processing, are cost effective, easy to use, require only a basic understanding of sedimentary features and facies, and can be combined with computed results. A case study illustrates the reconstruction of sedimentary features from a raw data log recorded by a six-arm dipmeter.